The NANOscientific Symposium Series (NSS) 2025 has successfully concluded its global program, bringing together the ...

Through a novel combination of machine learning and atomic force microscopy, researchers in China have unveiled the molecular ...

Atomic force microscopy (AFM) is a method of topographical measurement, wherein a fine probe is raster scanned over a material, and the minute variation in probe height is interpreted by laser ...

IIT Delhi researchers, with international collaborators, have developed AILA, an AI agent that can autonomously conduct ...

A new technical paper titled “Probing the Nanoscale Onset of Plasticity in Electroplated Copper for Hybrid Bonding Structures via Multimodal Atomic Force Microscopy” was published by researchers at ...

AILA is an AI lab assistant developed by researchers at IIT Delhi and collaborators, capable of performing scientific ...

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

We know that the process of viral uptake into cells begins with interactions between proteins hemagglutinin and neuraminidase ...

A further development in atomic force microscopy now makes it possible to simultaneously image the height profile of nanometer-fine structures as well as the electric current and the frictional force ...