For quality control purposes, wafers, such as semiconductor or flat-panel display (FPD) chips, need to be examined under a microscope to verify that they meet specifications related to both circuit ...

Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...

A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...

This technology has been developed to inspect semiconductor wafers and identify flaws and features on a nano-technology scale. However, the sensors, algorithms, neural network systems, optics and ...

YORKTOWN HEIGHTS, N.Y. — IBM Corp. has grown catalyst-free nanotube networks on silicon carbide substrates, the company said last week. With atomic-force microscopy verifying the results, researchers ...

In this section, the manufacturing requirements associated with advanced semiconductor lithography are discussed. This is followed by a discussion of lithographic approaches being used or being ...

FORT WORTH, Texas, Oct. 07, 2025 (GLOBE NEWSWIRE) -- SecureFoundry, a U.S.-based semiconductor technology company enabling secure, mixed-volume manufacturing, today introduced its Hyper-Beam Array ...