One of the common modes of scanning probe microscopy (SPM) is Magnetic force microscopy (MFM). As indicated by the name, SPM is used to map magnetic properties. On the nanoscale, MFM probes local ...

Using light to measure ever-smaller objects has been central to progress in many scientific disciplines for centuries. As far back as 1873, German physicist Ernst Abbe proved that light diffraction ...

SEM stands for scanning electron microscope. The SEM is a microscope that uses electrons instead of light to form an image. Since their development in the early 1950's, scanning electron microscopes ...

Magnetic force microscopy (MFM) is one of the modes of scanning probe microscopy (SPM). As the name implies, it is used to map magnetic characteristics. MFM investigates the local magnetic fields at ...