Researchers and industries have been using transmission electron microscopy (TEM) to study semiconductors' stacking and dislocation faults. This article considers the analysis of crystal structures.
What is Electron Backscatter Diffraction (EBSD)? Electron backscatter diffraction (EBSD), also known as backscatter Kikuchi diffraction (BKD), is a powerful characterization technique used to analyze ...
MapSweeper software revolutionizes EBSD analysis by overcoming traditional indexing limitations, enhancing accuracy and speed in materials characterization.
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